Soft X-ray / XUV / VUV Spectrograph

EVEREST Soft X-ray / XUV / VUV Spectrograph

Our XUV / VUV spectrograph features aberration-corrected flat-field imaging and is available with three gratings covering the spectral ranges 117 nm (124073 eV), 580 nm (24815.5 eV) and 24200 nm (51.76.2 eV). In order to maximize light collection, the spectrometer can be used without an entrance slit over a variety of source distances, with 317 nm, 1080 nm and 24200 nm spectral coverage. Its modular design is able to match different experimental geometries and configurations. It features an integrated slit holder, gate valve and filter insertion unit, as well as motorized grating positioning along 3 axes.


  • Flat-field grazing-incidence spectrograph
  • Wavelength coverage with single gratings:
    • Soft X-Ray: 1-17 nm (1240-73 eV)
    • XUV: 5-80 nm (248-15.5 eV)
    • VUV: 24-200 nm (51.7-6.2 eV)
  • Operation with and without entrance slit
  • Adapters for different geometry options
  • Integrated gate valve and filter insertion unit
  • Operating pressure <10-6 mbar Oil-free pump system for stand-alone vacuum operation optionally available
  • Flexible choice of detectors: X-ray CCD camera or MCP camera system
  • User-friendly acquisition and viewer software, including post-processing tools.


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  2. P. Heissler et al., Few-Cycle driven relativisticallly oscillating plasma mirrors: A source of intense isolated attosecond pulses, Phys. Rev. Lett. 2012, 108, 235003.
  3. P. Heissler et al., Towards single attosecond pulses using harmonic emission from solid-density plasmas, Appl. Phys. B 2010, 101, 511.
  4. Y. Nomura et al., Attosecond phase locking of harmonics emitted from laser-produced plasmas, Nature Phys. 2009, 5, 124.